Detect Particles Down to 2 nm
Our cutting-edge technology enables detection and measurement of airborne particles down to 2 nm. This capability empowers you to reduce risk and improve quality in your electronics manufacturing processes as well as remain at the forefront, driving innovation and improving cost-effectiveness.
Precise Monitoring and Control of Particle Contamination Levels
Those are key to not only minimize the risk of defects, but also to ensure compliance with industry standards. This enables you to take proactive measures to maintain the integrity of your semiconductor production environment – saving money.
Minimize Particle-Related Defects, Improve Device Yield and Quality
By integrating TSI state-of-the-art airborne particle detection technology into your manufacturing processes, you're making a critical strategic investment in quality, efficiency, and risk reduction. By leveraging our decades of industry experience and offering detection solutions – down to 100 nm, 10 nm, and 2 nm – TSI is the right partner to provide the capabilities you need to prevent defects, malfunction, or failure while upholding the highest quality standards.