Improving Your Surface Defect Inspection

Wafer and Reticle Contamination Standards

MSP provides high-quality surface defect contamination standards for the semiconductor industry. These standards enhance semiconductor manufacturing inspection systems by ensuring consistent particle size and count control, thereby reducing inconsistencies across inspection tools and maximizing device yield.

Certified for wafer and reticle inspection tools, MSP's contamination standards support development, qualification, calibration, and monitoring of inspection systems. They are compatible with various substrates including wafers and reticles of different sizes, used across semiconductor fabs for equipment qualification, process maintenance, and high-volume manufacturing of electronic devices.

Products

PRE Challenge Wafers and Photomasks

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Qual-Dep Qualification Contamination Standards

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Cal-Dep Calibration Contamination Standards

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Dev-Dep Development Contamination Standards

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