Products

With a focus on precision, reliability, and efficiency, our products empower manufacturers to maintain stringent quality standards, optimize production processes, and minimize the risk of defects in the electronic components and devices.

At TSI and MSP, we recognize the unique challenges electronics manufacturers face, and that's why we offer a comprehensive range of advanced instruments tailored specifically to your needs. These instruments include cutting-edge particle detection systems, surface defect inspection tools, vaporizers for thin film deposition and contamination monitoring solutions.

Whether it's ensuring cleanroom compliance, monitoring gas purity, delivering consistent thin film deposition, or inspecting surface defects, TSI and MSP provide innovative solutions to meet the evolving needs of the electronics manufacturing industry.

Featured Product

High-Flow Turbo II Vaporizer 2855PE

MSP, a division of TSI®, offers a completely new line of Vaporizers for liquid source vaporization in gas-phase processing such as Chemical Vapor Deposition (CVD) and Atomic Layer Deposition (ALD) used in semiconductor device fabrication.

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Cleanroom Monitoring Systems

Certified to monitor particle counts and other relevant parameters.

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Condensation Particle Counters

Enabling detection and measurement of airborne particles down to 2 nm.

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Handheld Particle Counters

Lightweight, portable, ideal for cost-effective spot checking.

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Liquid Flow Controllers

Reliable, high-performance liquid vapor delivery for CVD and ALD.

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Liquid Particle Instrument

Down to 10 nm particle detection in ultra-pure water (UPW).

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Particle Deposition Systems

Producing wafer contamination standards for inspection and quality.

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Particle Size Standards

For accurate calibration of wafer and photomask inspection systems.

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Portable Particle Counters

Made for real-time cleanroom particle counting: ready for measurement.

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Remote Particle Counters

Ideal for monitoring of large cleanrooms or critical environments.

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Vapor Process Gas (VPG) Filters

Removes nanometer and micrometer particles from the gas/vapor mixture.

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Vaporizers

Liquid source vaporization in gas-phase processes like CVD and ALD.

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Wafer and Reticle Contamination Standards

For consistent and repeatable particle size and count control.

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More Electronics Manufacturing Product Info

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With our expertise and innovative solutions, TSI and MSP position electronics manufacturers to overcome challenges and achieve success in their operations.

TSI instruments enable precise particle measurement, detecting particles as small as 2 nm, providing reliable data to address critical industry challenges and minimize process risks.

MSP's Vaporizers facilitate consistent thin film deposition, reducing defects and enabling enhanced processes.

Additionally, MSP provides contamination standards for calibration, traceable to NIST, deposited on various substrates to calibrate inspection systems. Our Particle Deposition Systems can deposit particles as small as 10 nm, enhancing semiconductor inspection tool calibration.

Together, TSI and MSP equip manufacturers with the tools and expertise to overcome obstacles and excel in their operations.