Products

With a focus on precision, reliability, and efficiency, our products empower manufacturers to maintain stringent quality standards, optimize production processes, and minimize the risk of defects in the electronic components and devices.

At TSI and MSP, we recognize the unique challenges electronics manufacturers face, and that's why we offer a comprehensive range of advanced instruments tailored specifically to your needs. These instruments include cutting-edge particle detection systems, surface defect inspection tools, vaporizers for thin film deposition and contamination monitoring solutions.

Whether it's ensuring cleanroom compliance, monitoring gas purity, delivering consistent thin film deposition, or inspecting surface defects, TSI and MSP provide innovative solutions to meet the evolving needs of the electronics manufacturing industry.

Featured Product

High-Flow Turbo II Vaporizer 2855PE

MSP, a division of TSI®, offers a completely new line of Vaporizers for liquid source vaporization in gas-phase processing such as Chemical Vapor Deposition (CVD) and Atomic Layer Deposition (ALD) used in semiconductor device fabrication.

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Cleanroom Monitoring Systems

Advanced software suite for monitoring particle counts and environmental parameters with high reliability.

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Condensation Particle Counters

Detect and measure airborne particles down to 2 nm with advanced condensation technology.

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Handheld Particle Counters

Lightweight, portable counters ideal for spot checking and identifying contamination sources.

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Liquid Flow Controllers

Reliable liquid vapor delivery controllers for enhancing CVD, ALD, and thin film deposition.

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Liquid Particle Instrument

Detects nanoparticles down to 10 nm in Ultra-Pure Water (UPW) for semiconductor applications.

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Particle Deposition Systems

Produces precise, traceable contamination standards for calibrating wafer inspection systems.

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Particle Size Standards

For accurate calibration of wafer and photomask inspection systems.

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Portable Particle Counters

Real-time, portable particle counting with built-in regulatory compliance features.

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Remote Particle Counters

Compact, remote counters for continuous monitoring in large or critical cleanroom environments.

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Vapor Process Gas (VPG) Filter

Vapor Process Gas (VPG) Filters

Filters for removing particles from gas/vapor mixtures in ALD/CVD, enhancing system performance.

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Vaporizers

High-efficiency vaporizers for CVD and ALD, capable of handling thermally sensitive liquids.

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Wafer and Reticle Contamination Standards

High-quality contamination standards for validating and calibrating wafer/reticle inspection systems.

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More Electronics Manufacturing Product Info

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With our expertise and innovative solutions, TSI and MSP position electronics manufacturers to overcome challenges and achieve success in their operations.

TSI instruments enable precise particle measurement, detecting particles as small as 2 nm, providing reliable data to address critical industry challenges and minimize process risks.

MSP's Vaporizers facilitate consistent thin film deposition, reducing defects and enabling enhanced processes.

Additionally, MSP provides contamination standards for calibration, traceable to NIST, deposited on various substrates to calibrate inspection systems. Our Particle Deposition Systems can deposit particles as small as 10 nm, enhancing semiconductor inspection tool calibration.

Together, TSI and MSP equip manufacturers with the tools and expertise to overcome obstacles and excel in their operations.