Condensation Particle Counters

Precision Measurement for Nanoparticle Detection

As semiconductor geometries shrink, the sensitivity required to detect yield-killing contaminants increases. TSI® Condensation Particle Counters (CPCs) utilize advanced condensation technology to grow nanometer-sized particles into a detectable size range, allowing for the precise measurement of particles as small as 2 nm. This level of sensitivity is crucial for advanced technology nodes where even the smallest airborne contaminants can cause significant defects on a wafer.

Supporting Advanced Manufacturing Yields

In cleanroom environments, "invisible" threats often pose the biggest risks. Standard optical particle counters may miss ultrafine particles that CPCs can easily detect. By integrating TSI® Condensation Particle Counters into your monitoring strategy, you gain a deeper insight into your cleanroom's air quality. This enhanced visibility enables you to identify and mitigate sources of contamination that others might miss, helping to improve process stability and product yield.

Reliable Data for Critical Decision Making

TSI® CPCs are engineered for stability and repeatability, ensuring that the data you collect is accurate and actionable. Whether used for filter testing, root cause analysis, or routine monitoring in ultra-clean environments, these instruments provide the confidence needed to make informed operational decisions. By leveraging the superior detection limits of TSI® technology, facility managers and process engineers can proactively manage contamination risks, supporting a cleaner, more efficient production environment.