Wafer box used in electronics for the fabrication of integrated circuits

Consequences of Inadequate Parts Cleanliness Testing

Process Optimization Potential

Semiconductor manufacturing involves complex processes where even the tiniest particles or contaminants can cause defects, malfunctions or failures in electronic devices. Failure to detect particle contamination and optimize cleanliness processes can lead to poor product quality and revenue losses. Adopting an effective parts cleanliness plan can mitigate quality issues and lead to improved manufacturing processes.

Parts and component assemblies used in semiconductor process and tools may retain contaminants such as oils, particles, or residues from manufacturing processes. These contaminants can migrate to other processes during semiconductor manufacturing and affect optical precision, wafer defects, and reduced product yields. The result of lower product yields in less revenue, more waste, and loss of supplier confidence.

Leveraging TSI Particle Counters for Process Optimization in Semiconductor Manufacturing

TSI particle counters easily integrate into a parts cleanliness test plan. An effective test plan can lead to process optimization by providing immediate notification of particulate contamination that affect product quality. A parts cleanliness test plan can be as simple as testing a few components from a batch, placing them into a clean chamber or mini environment, and use clean dry air (CDA) to remove particles on the parts, as a TSI airborne particle counter samples the chamber. The entire test only takes minutes—but saves countless hours and revenue lost if the defective parts are installed into semiconductor manufacturing processes.

TSI instruments can easily integrate with advanced semiconductor process tools such as EUV photolithography, wafer defect analysis, FOUP transport, and more. A TSI targeted particulate monitoring plan provides immediate response to particle events, trend analysis, process improvements, lower product risk, and higher throughput. TSI instruments meet ISO industry standards 14644, 8573, and 21501-4, so you can be confident your data reports and process audits are accurate.

Allow TSI to help you develop a particle monitoring plan that meets your rigorous standards and improve your product quality, which leads to more revenue and less waste. Our training programs further enhance personnel expertise, fostering a culture of adherence to best practices and optimizing overall manufacturing efficiency.
 

Learn More About Parts Cleanliness Testing and Which Solutions We Provide - Click Here.
 

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