1nm Scanning Mobility Particle Sizer (SMPS) 3938E57
Take your measurements to the limit of detection: scan particles as small as 1 nm. Measure the size and number concentration of particles as small as 1 nm with high resolution and speed. This second generation of 1 nm particle sizing instrumentation builds on TSI’s 30+ years of Scanning Mobility Particle Sizer (SMPS™) spectrometer expertise. An SMPS system that includes the Nano Enhancer 3757 and Differential Mobility Analyzer (DMA) 3086 enables you to monitor reaction kinetics and new particle formation of engineered and natural aerosol particles at those smallest, critical sizes.