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Flow Rate 1 CFM (28.3 L/min) / Particle Size Range 0.5 to 25 μm / Integrated Pump / VHP Option

Water-Based Condensation Particle Counters (WCPCs) deliver accurate concentrations of particles in gases while making use of safe, eco-friendly and easily available distilled water. When combined with a particle sizer, nanoparticle size distributions and concentration can be...

Glass wafers are increasingly used in semiconductor manufacturing. Learn more about the benefits and how MSP can help enhancing inspection systems with precise calibration and contamination standards.

As semiconductor processes become more sensitive, emerging UPW monitoring solutions are closing critical detection gaps by enabling real-time, nanoscale particle measurement that traditional methods miss.

Flow Rate 0.1 CFM (2.83 L/min) / Channel Sizes 0.2 to 25 μm / Integrated Pump

Compliance with ISO 14644 standards is essential to control airborne particulate contamination levels.

We offer cutting-edge solutions tailored to the unique (nanoscale) challenges of the semiconductor manufacturing market. With our advanced instrumentation and expertise, we provide critical tools for process control, quality assurance, and cleanroom monitoring. Stay ahead of...

Discover how MSP's Particle Deposition System enables precise calibration of defect inspection systems crucial for maintaining high yields and quality in sub-10nm semiconductor devices.