Dev-Dep Development Contamination Standards

Custom Solutions for Advanced R&D

Innovation in semiconductor manufacturing demands tools that can detect increasingly smaller and more complex defects. Dev-Dep™ Development Contamination Standards are designed to assist engineers and developers who are pushing the boundaries of inspection technology. By offering a high degree of customization, MSP enables you to simulate specific defect scenarios that are critical to your development goals. Whether you are testing the limits of a new optical system or refining algorithms for defect classification, these standards provide the precise physical references needed to validate performance and sensitivity.

Accelerating Time to Market

Time is a critical factor in the electronics industry. Dev-Dep™ standards help shorten learning cycles by providing rapid access to the specific contamination data needed for tool development. Instead of relying on inconsistent or generic test wafers, you can deploy standards that mimic real-world process conditions or target specific theoretical limits. This targeted approach assists in identifying hardware or software issues earlier in the development phase, helping to streamline the path from prototype to production-ready equipment.

Optimizing Process Control Protocols

Beyond equipment development, Dev-Dep™ standards are invaluable for establishing robust process control protocols in the fab. Process engineers can use these customizable standards to determine the detection limits of their current toolsets and define precise acceptance criteria for new manufacturing steps. This capability supports efficient tool utilization and helps maximize device yield by enabling the detection of critical defects before they impact production volume. With specifications that include substrate base items and customizable deposits—such as particle material, size, and position—Dev-Dep™ standards allow for precise alignment with your unique application requirements.