Electrostatic Classifiers and DMAs

Electrostatic classifiers and differential mobility analyzers (DMAs) size-select aerosol particles by electrical mobility to deliver narrow, well-characterized distributions from the nanometer to submicron range. These systems help researchers generate monodisperse aerosols for instrument calibration, material synthesis, and fundamental aerosol studies. With stable sheath flow control, configurable DMA columns, and precise charge neutralization, they support high-resolution sizing and reproducible results. Pair with condensation particle counters, electrometers, or spectrometers to build complete nanoparticle measurement workflows for atmospheric science, filtration, toxicology, and manufacturing R&D.

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Electrostatic Classifier 3082

Our latest generation of Electrostatic Classifier, Model 3082, continues to be the solution in...

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Differential Mobility Analyzer 3081A

A Differential Mobility Analyzer (DMA) is the key component for particle sizers like SMPS...

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Differential Mobility Analyzer 3085A

A Differential Mobility Analyzer (DMA) is the key component for particle sizers like SMPS...

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Differential Mobility Analyzer 3086

A Differential Mobility Analyzer (DMA) is the key component for particle sizers like the 1nm SMPS...

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Differential Mobility Analyzer 3083

A Differential Mobility Analyzer (DMA) is the key component for particle sizers like SMPS&trade...

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Differential Mobility Analyzer Upgrade Kits

Enhance DMA performance with modern controls, stable flows, and data connectivity — without replacing your entire system.

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Electrostatic classifiers and DMAs provide the foundation for mobility-based aerosol sizing. By exposing charged particles to a controlled electric field within a laminar sheath flow, a DMA selectively transmits a narrow band of electrical mobility, which correlates with particle size. This approach supports robust measurements from a few nanometers through the submicron range and enables true monodisperse aerosol generation for downstream experiments.

Key advantages for research and development:

  • High Resolution: Adjustable sheath-to-aerosol ratios and DMA geometries help refine transfer functions for sharper size cuts.
  • Reproducibility: Stable flow control and integrated charge neutralization promote consistent classification across long studies.
  • System Flexibility: Interchange DMA columns, neutralizers, and flow modules to align with evolving methods.
  • Workflow Integration: Combine with condensation particle counters, Faraday cup electrometers, optical detectors, or spectrometers to form complete systems.

Typical applications:

  • Instrument Calibration: Produce size-selected aerosols to validate CPCs, OPCs, SMPS, and other detectors.
  • Materials Research: Generate reference nanoparticle sizes for synthesis, agglomeration studies, and functional testing.
  • Filtration and Respiratory Studies: Characterize penetration versus particle size with precise upstream challenges.
  • Atmospheric Science: Resolve ambient nanoparticle distributions and support source apportionment studies.

Selection guidance:

  • DMA Geometry: Long-column DMAs favor resolution; compact designs support portability and higher throughput.
  • Charge Neutralization: Choose soft X-ray or other neutralization options to achieve near-Boltzmann charge distributions.
  • Flow Architecture: Higher sheath flows can improve resolution; verify compressor or clean air supply capacity.
  • Compatibility: Confirm interfaces with CPCs, aerosol generators, and data systems for a seamless setup.

With modern controllers, automated scans, and data connectivity, electrostatic classifiers and DMAs help teams accelerate method development, reduce measurement uncertainty, and collaborate across sites. Whether you are building a primary sizing standard for your lab or creating a turnkey classification line for production support, these components provide a dependable backbone for nanoparticle research. Speak with our team to configure the right column, flows, and accessories for your protocols.


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