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TSI® being Platinum Sponsor

Visit us at our booth, in our tutorial or listen to our presentation.

40th AAAR Annual Conference 2022

03 Okt 2022 - 07 Okt 2022 Raleigh Convention Center in Raleigh, North Carolina https://www.aaar.org/2022/

Join us at our booth to discover more about our newest solutions in wide-range ultrafine particle monitoring as well as indoor air quality and filter testing.Diese Veranstaltung findet in den USA statt.

TSI® is proud to be the Platinum Sponsor of the 40th Annual Conference of the American Association for Aerosol Research (AAAR), taking place October 3-7, 2022, in the Raleigh Convention Center in Raleigh, North Carolina.

From the website, "an exciting array of Plenary Lectures, Special Symposia, Poster Sessions, Oral Platform Sessions, Tutorials, and Special Events will take place from Monday through Friday".

On Monday, October 3rd, we warmly invite you to attend the TSI® Hands-On Tutorial which will run from 3:00 to 4:00 pm. We will introduce you to ambient ultrafine particle monitoring with various instrumentation types and sampling system arrangements, encompassing both full compliance with standards, and the flexibility afforded by a component-based design.

Promoting Young Talents

TSI® sponsors the Early Career Event taking place on Wednesday, October 5th, 11:30 am to 1:00 pm. In this year's event, experts from different sectors and disciplines will be talking about elevating the voices of early career scientists in a series of roundtable discussions.

TSI® also foster young talent by sponsoring the Student Poster Competition Award.

Program Now Available

TSI® expert Justin Koczak will be presenting about "Performance Comparison of TSI's New Wide-Range and Established Long Differential Mobility Analyzer" on Wednesday, October 5th, 10:30 am in 5IM INSTRUMENTATION AND METHODS I: DMA - 302 B/C.

Talk to Us in the Exhibition Area

Visit us at our booth to learn more about our comprehensive air quality monitoring solutions and how we can support your applied aerosol research.