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We invite you to join us at the Annual EIA Conference & Exhibition; the source for information on mold identification and remediation, environmental sampling and analysis, lead-based paint abatement, asbestos management, indoor air quality, regulatory compliance audits, environmental site assessments, and environmental management systems.
EIA’s National Conference has long earned our attendees continuing education points from ABIH, ACAC and other certifying bodies. Information generation, collection and dissemination is our primary focus. Therefore, we strive to ensure that practical, real world information will be provided to those who need it most - your fellow industry professionals and potential clients.
Don't miss Steve Boehm, Global Product Manager at TSI, presenting on the topic of Considerations for Certifying Photometric PM 2.5 & PM 10 Monitors.
Many countries have established particulate mass (PM2.5 and PM10) reference methods for measuring ambient aerosols in the outdoor environment. Continuous real-time photometric systems to measure ambient aerosols are available for use as indicative and near-reference systems to monitor fugitive emissions from facilities, remediation sites and construction activities. These indicative systems can be used in addition to or in lieu of reference method monitoring systems. These near-reference units are simple to use, configurable, designed for purpose, require less effort and support to setup and run, and cost much less than their reference method counterparts. While they may not have a federal reference certification they do have localized certifications and can be very useful in monitoring many fence-line real-time applications.
This presentation will outline fence-line and remediation outdoor fugitive monitoring and the advantages of deploying lower cost PM instruments. These instruments can be effectively deployed for continuous, real-time, direct reading indicative instruments for source apportionment ambient aerosol measurements.
Register to attend the show here: https://eia-usa.org/meetinginfo.php?id=47&ts=1603918570