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International Aerosol Conference 2022
We cordially invite you to our TSI® Reception to celebrate our reunion!
TSI is proud to be the Platinum Sponsor of the 11th International Aerosol Conference (IAC) taking place 4-9 September 2022 in Athens, Greece. From the website, "we are well prepared to host both virtually and live".
We are excited to meet you in person again and warmly invite you to stop by at our booth to talk about your current research topics. We can help you overcome challenges in general aerosol research, ultrafine particle measurements and indoor air quality monitoring as well as other size, number, mass and sampling measurement applications.
Highlights: Stop by the IAC 2022 Photo Booth and and take a selfie in front of the beautiful Athens skyline. You can post this on social media with the hashtag, #IAC2022_Athens.
Moreover, we will showcase a full CEN-compliant SMPS™ System for harmonized monitoring of ultrafine particles at the booth!
We cordially invite you to our TSI Reception to celebrate our reunion. Enjoy a night on us with a fantastic view over Athens, lots of drinks, food, giveaways and networking!
Wednesday, 7 September
Reception starts at 7:00 pm.
at SKYFALL (Rooftop bar with a fantastic view over Athens!)
Mark. Mousourou 1, Athens 116 36
Click here for directions
Please indicate your interest by filling out the form below to register.
During IAC 2022, you may visit the TSI booth to pick up your admission ticket.
Poster: "Calibration vs. Validation: Ensuring Aerosol Instrument Performance, with a Focus on Continuous Ultrafine Particle Monitoring"
by A. J. Tiwari, S. H. Schmitt, T. Tritscher, A. Jaffer, J. Spielvogel, T. Krinke, O. F. Bischof
5:00 - 7:00 pm, in Poster Area
Presentation: "Calibration of Condensation Particle Counters for Reduced Pressure Applications"
by O. F. Bischof, P. Weber, U. Bundke, A. Petzold and A. Kiendler-Scharr
2:15 - 2:30 pm, in Multipurpose Hall
Presentation: "Closure in the Total Particle Number Concentration from Scanning Mobility Particle Sizer™ and Condensation Particle Counter in Parallel Ambient Measurements"
by S. H. Schmitt, A. J. Tiwari, A. Jaffer, J. H. Scheckman, T. Krinke, O. F. Bischof and T. Tritscher
3:30 - 5:30 pm, in Multipurpose Hall