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NOTICE: This event, originally scheduled for April 26-30, 2020, has been rescheduled for October 5-8, 2020 in response to concerns about the COVID-19 pandemic. See more information about #ESTECH2020 at this link on the event website: https://www.iest.org/Meetings/ESTECH
ESTECH 2020 is the 66th Annual Technical Meeting and Exposition of IEST, the Institute of Environmental Sciences and Technology. This event offers courses in contamination control and environmental testing, in addition to exposition and networking opportunities.
TSI specializes in airborne particle counters and software for classifying and monitoring manufacturing cleanrooms in a variety of applications, including but not limited to pharmaceutical, semiconductor, electronics and industrial environments. TSI instruments are top-choice for improving product quality, and eliminating product waste, interventions and interruptions—to reduce risk and costs. Select TSI particle counters have enhanced data integrity capabilities to meet regulatory requirements. Visit the TSI team in booth 14 in Minneapolis/St. Paul, Minnesota! Bring us your questions and challenges about facility monitoring and contamination control.
Learn more about TSI Contamination Control Products >
Monitoring for Nanoparticles | April 28, 2020 | 10:10 a.m. - 12:00 p.m.
Contamination Control / Nano Sessions
Kelvyn Henderson, Application Engineer
Using Laser Induced Fluorescence to Monitor Airborne Viable Contamination
April 28, 2020 | 1:15 - 3:05 p.m. | Contamination Control / Nano Sessions
Mike Dingle, Field Application Specialist