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MSP’s Turbo II™ Vaporizer helped a CVD OEM double output and cut defects - boosting yield, efficiency, and customer satisfaction in tight gas box spaces.

It is crucial in both automotive and industrial electronics to ensure optimal performance and longevity of sensitive components. Effective contamination control practices in the sectors like photonics and optics, data farms and automotive applications (e.g. MEMS, paint, EV...

*Diese Seite ist leider nur in Englisch verfügbar.*This manually-loaded particle deposition system deposits PSL and SiO2 spheres as small as 30 nm. Calibrate and qualify your defect inspection tools with ease, confidence, and efficiency by producing high volumes of high...

Extrem niedrige Falschzählraten ermöglichen genaue 10 nm-Messungen zur sicheren Überwachung von Mini-Umgebungen und Prozessgasen - damit Ihre Produkte vor Verunreinigungen durch Nanopartikel geschützt sind.

Built upon field proven technology, the MSP Turbo™ Liquid Flow Controllers 2950 were engineered to pair with MSP Turbo II™ Vaporizers to provide a reliable, high-performance liquid vapor delivery solution for semiconductor thin film deposition processes (including CVD, PECVD...

MSP's Qual-Dep™ Wafer Qualification Contamination Standards are designed to meet your precise tool qualification needs, offering reliable solutions for validating and aligning inspection systems for ensuring optimal performance and reducing risks in semiconductor manufacturing.

*Diese Seite ist leider nur in Englisch verfügbar.*Filtration down to 1 nm and below