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The Air Velocity Transducer 8475 (omnidirectional) is ideal for both temporary and permanent installations for air velocity measurements in research and development labs, manufacturing processes, and other applications.

Measures velocity, temperature, humidity, differential pressure, barometric pressure and has inputs for two K alloy thermocouples. Includes a straight, telescopic probe / data logging.Other Models AvailableDescriptionRequest a QuoteTA465-ACIncludes ISO 17025 accreditation for...

The DP-Calc™ Micromanometer 5815 allows you to easily make HVAC pressure measurements. This robust instruments can be used with pitot probes to measure duct velocity.Request A QuoteOther Models AvailableDescriptionRequest a Quote5815-ACIncludes ISO 17025 accreditation for...

Flowmeter +DP, 300 lpm, Air, CO2, N2, 22mm, 1/2 inISO 17025 CertifiedRange: 0 to ± 300 Std L/min Accuracy: 2% of reading Calibration: Air, CO2, N2* Includes Standard Accessory Kit*Nitrogen gas is a correction from the air calibration

Flowmeter, 300 lpm, Air, O2, N2, 22mm, 1/2 inISO 17025 CertifiedRange: 0 to ± 300 Std L/min Accuracy: 2% of reading Calibration: Air, O2, N2* Includes Standard Accessory Kit*Nitrogen gas is a correction from the air calibration

Flowmeter, 300 lpm, Air, N2, 22mm, 1/2 inISO 17025 CertifiedRange: 0 to ± 300 Std L/min Accuracy: 2% of reading Calibration: Air, N2* Includes Standard Accessory Kit*Nitrogen gas is a correction from the air calibration

Compliance with ISO 14644 standards is essential to control airborne particulate contamination levels.

Glass wafers are increasingly used in semiconductor manufacturing. Learn more about the benefits and how MSP can help enhancing inspection systems with precise calibration and contamination standards.

As semiconductor processes become more sensitive, emerging UPW monitoring solutions are closing critical detection gaps by enabling real-time, nanoscale particle measurement that traditional methods miss.