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TSI’s electrostatic classifiers and DMAs have a long history, over 40 years, of using the electrical mobility technique to measure particle size.

The 8380 maximizes worker productivity by saving you valuable time on the jobsite for ultimate profitability.

MSP, a Division of TSI, supplies wafer contamination standards and reticle contamination standards in the semiconductor industry for consistent and repeatable particle size and count control.

VelociCalc® Air Velocity Meters measure air velocity and temperature, calculate flow rate and perform statistical calculations.