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SEMICON Japan 2025
TSI® and MSP, a Division of TSI®, are proud to jointly exhibit at SEMICON Japan 2025, the premier event bringing together the global semiconductor manufacturing community. From advanced particle measurement to semiconductor process optimization, we deliver the precision tools and solutions you need to push innovation forward.
What You'll See at Our Booth
TSI Semiconductor Monitoring Solutions
- Nanoparticle Monitoring in Ultrapure Water — TSI Nano LPM™ System for true 10 nanometer (nm) nanoparticle detection in semiconductor ultrapure water (UPW)
- Parts Cleanliness Testing — Ensure reliability with precise cleanliness evaluations down to 2 nm
- Particle Detection in Hugh-Purity Gases — Reliable and repeatable measurements down to 2 nm
- Airborne Particle Monitoring — Advanced systems for monitoring airborne particles as small as 10 nm
MSP Vapor Delivery Solutions
- Vapor Delivery Solutions — Optimize thin-film deposition with our advanced Direct Liquid Injection (DLI) tools
- Liquid Flow Control and Vapor/Gas Filtration
MSP Wafer Contamination Standards
- Particle Removal Efficiency (PRE) Challenge Wafers — Validate particle removal efficiency with confidence.
- Calibration Standards — Support for surface scanning and inspection tool calibration down to 10 nm
CMP Slurry Analysis
- Gain single-particle insights for precise slurry size distribution.
Why Visit Us
TSI and MSP are trusted partners to semiconductor fabs worldwide. Together, we offer end-to-end contamination control solutions that improve reliability, ensure quality, and support advanced manufacturing processes from R&D through production.
Stop by our booth to connect with our experts, see the technology in action, and learn how TSI + MSP can help you achieve your semiconductor manufacturing goals.
We look forward to seeing you in Tokyo!