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Laser Aerosol Spectrometer 3340

SKU: 3340

The Model 3340 Laser Aerosol Spectrometer is discontinued.

Product Details

The Laser Aerosol Spectrometer Model 3340 uses patented wide-angle optics and an intracavity laser to measure the size and number concentration of airborne particles. It features a monotonic response with respect to light scattering intensity in the Mie range for precise resolution. While the instrument is calibrated with NIST traceable Polystyrene Latex (PSL) spheres, users can easily perform custom calibrations with other aerosols. This Laser Aerosol Spectrometer is unique in its ability to measure both sub- and supermicron particles over such a wide range, making it a true workhorse in any lab.


Quality optical instruments are useful in a variety of applications due to their ease of use, fast measurement time, robustness, and reliability. A few common applications are listed below:

  • Air cleaner testing (CADR testing)
  • HEPA/ULPA filter testing
  • Indoor air studies
  • Atmospheric research
  • Inhalation toxicology & exposure monitoring
  • Pharmaceutical research and manufacturing monitoring
  • Semiconductor process control
  • Fundamental aerosol research

Features & Benefits

  • Ultra-high Sensitivity & Superior Resolution
    • Dynamic Size Range: 0.09 to 7.5µm
    • Typical Resolution is within 2.5% of the particle diameter at 0.1µm
    • 18,000 part/cm 3 at 0.01 L/min
  • Ease of Use
    • On-board Windows®-based PC with Excel. No need to procure and dedicate a laptop to operate your instrument
    • Intuitive LabView™ based software
  • Flexibility
    • 100 particle size channels: user configurable. Users can zero in on a specific size range or match the resolution of a different instrument
    • User adjustable flow rate: Allows the user to optimize the flow rates for a specific application at the click of a mouse
  • State-of-the-Art Optical & Detection System
    • Patented wide angle optics and intercavity laser
    • Highly sensitive photodetectors, automated gain ration adjustment and laser reference compensation