SPx-Calibration-Standards
MSP's SPx Calibration Standards are precision engineered tools for the calibration, verification and re-qualification of the most common wafer surface inspection systems used in semiconductor manufacturing. These standards play a crucial role in ensuring the accuracy and...
Main Sources of Particle Shedding and Possible Impacts on Yield
Understanding the sources of particle shedding and impacts on yield is essential for effective mitigation strategies.
Turbo Vaporizer 2821
The 2821 MSP Turbo™ Vaporizer is our highest liquid flow rate unit. This model features 2400W of heater power and can be used to deliver flow rates up to 6000g/hr (TEOS or equivalent).
Prioritize Precision and Reliability for Maximum Safety in Aerospace and Defense
From the meticulous assembly of satellites and spacecraft to the intricate fabrication of composite materials for jet engines, every step demands seamless integration of cutting-edge technology and expert craftsmanship, based on precision and reliability. Avionics systems...
Achieve a Breakthrough in ALD Process for Cobalt Thin-Film Deposition
MSP transformed cobalt thin-film deposition for a global semiconductor giant struggling with CCTBA vaporization, including low vapor pressure and thermal instability, leading to clogging and downtime.
Boost Throughput in CVD & ALD by Reducing Liquid Waste
With its rapid response time and advanced feedback capabilities, the Turbo™ LFC is set to revolutionize CVD and ALD processes.
AeroTrak-Plus Remote Particle Counter 7000 Series
流速0.1 CFM(2.83LPM),1 CFM(28.3 LPM)/通道粒径选项0.2-25μm
Dev-Dep Development Reticle Contamination Standards
Reticle/photomask contamination standards consist of particles deposited on 6 inch reticles with the industry's best particle size and count control. These certified standards for reticle inspection tools are totally customized for each customer.
Dev-Dep Development Wafer Contamination Standards
Wafer contamination standards consist of particles deposited on a wafer (sizes from 100 mm to 450 mm) with the industry's best particle size and count control. These certified standards for wafer inspection tools are totally customized for each customer.
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