产品

我们的产品以精准、可靠和高效为核心,助力制造商维持严格的质量标准、优化生产流程,并最大限度地减少电子组件和设备中的缺陷风险。

TSI 和 MSP 深知电子制造商面临的独特挑战,因此我们提供一系列专门满足您需求的先进仪器。这些仪器包括先进的粒子检测系统、表面缺陷检测工具、用于薄膜沉积的蒸发器以及污染监测解决方案。

无论是确保洁净室合规性、监测气体纯度、实现一致的薄膜沉积,还是检查表面缺陷,TSI 和 MSP 都为您提供了创新的解决方案,能够满足电子制造业不断变化的需求。

洁净室监控系统

经认证的粒子计数监测和其它相关参数监测。

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凝聚核粒子计数器

能够检测和测量低至2nm的尘埃粒子。

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手持式粒子计数器

轻便,便携,是具有成本效益抽查的理想选择。

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Liquid Flow Controllers

Reliable, high-performance liquid vapor delivery for CVD and ALD.

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Liquid Particle Instrument

Down to 10 nm particle detection in ultra-pure water (UPW).

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Particle Deposition Systems

Producing wafer contamination standards for inspection and quality.

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Particle Size Standards

For accurate calibration of wafer and photomask inspection systems.

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便携式粒子计数器

用于实时洁净室粒子计数:测量已就绪。

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远程粒子计数器

适用于大型洁净室或关键环境的监控。

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Vapor Process Gas (VPG) Filters

Removes nanometer and micrometer particles from the gas/vapor mixture.

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Vaporizers

Liquid source vaporization in gas-phase processes like CVD and ALD.

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Wafer and Reticle Contamination Standards

For consistent and repeatable particle size and count control.

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With our expertise and innovative solutions, TSI and MSP position electronics manufacturers to overcome challenges and achieve success in their operations.

TSI instruments enable precise particle measurement, detecting particles as small as 2 nm, providing reliable data to address critical industry challenges and minimize process risks.

MSP's Vaporizers facilitate consistent thin film deposition, reducing defects and enabling enhanced processes. 

Additionally, MSP provides contamination standards for calibration, traceable to NIST, deposited on various substrates to calibrate inspection systems. Our Particle Deposition Systems can deposit particles as small as 10 nm, enhancing semiconductor inspection tool calibration. 

Together, TSI and MSP equip manufacturers with the tools and expertise to overcome obstacles and excel in their operations.

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