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市场
半导体制造商需要精确的仪器，以确保其生产过程的完整性和效率。您是否预料到在更小的尺寸下工作所面临的挑战？你准备好推动高效的半导体制造了吗？
以纳米级测量专业技术迎接明天的挑战——确保精度、质量控制和可靠性的必备工具
我们提供量身定制的尖端解决方案，以应对半导体制造市场的独特（纳米级）检测难题 。凭借我们的先进仪器和专业知识，我们为过程控制、质量保证和洁净室监测提供关键工具。
保持竞争优势——相信 TSI 和 MSP 将成为您的首选合作伙伴，帮助您克服半导体生产过程中纳米级的挑战。
零部件洁净度测试不足的后果
工艺优化潜力
We offer cutting-edge technology for detecting particles as small as 2 nm, crucial for minimizing contamination risks in semiconductor manufacturing. Our precise instruments provide data to proactively maintain semiconductor production environments, ensuring compliance with industry standards and reducing the risk of defects. With solutions for parts cleanliness testing and particle detection in high-purity gases, we empower manufacturers to make informed decisions and maintain process integrity.
Additionally, our MSP Particle Deposition Systems enhance calibration of semiconductor inspection tools by depositing particles as small as 10 nm, ensuring accurate and repeatable measurements.
Our MSP Turbo II™ Vaporizers deliver consistent thin film deposition in Chemical Vapor Deposition (CVD) and Atomic Layer Deposition (ALD).Our comprehensive range of products includes particle counters and contamination control systems as well as vaporizers and contamination standards for inspection tool calibration, enabling semiconductor fabs to achieve optimal yields, minimize defects, and ensure compliance with industry standards.
