Auto-Load 10 nm Particle Deposition System 2300G3A - 10 nm
This fully automated particle deposition system deposits PSL and SiO2 spheres as small as 10 nm. Calibrate and qualify your defect inspection tools with ease, confidence, and efficiency by producing high volumes of high-quality custom 300 mm and 200 mm contamination standards....
Auto-Load 20 nm Particle Deposition System 2300G3A - 20 nm
This fully automated particle deposition system deposits PSL and SiO2 spheres as small as 20 nm. Calibrate and qualify your defect inspection tools with ease, confidence, and efficiency by producing high volumes of high-quality custom 300 mm and 200 mm contamination standards....
High-Flow Turbo II Vaporizer 2855NP
MSP's Turbo II™ Vaporizer 2855NP is designed for applications that require mid to high vapor flow rates. Based off of the field proven, highly reliable, and low-maintenance MSP Turbo™ Vaporizers, the new 2855NP delivers twice the vapor output in a footprint that is half the...
Manual-Load 30 nm Particle Deposition System 2300G3M – 30nm
This manually-loaded particle deposition system deposits PSL and SiO2 spheres as small as 30 nm. Calibrate and qualify your defect inspection tools with ease, confidence, and efficiency by producing high volumes of high-quality custom contamination standards. Manual loading...
Liquid Flow Controllers Without Valves 2950
Built upon field proven technology, the MSP Turbo™ Liquid Flow Controllers 2950 were engineered to pair with MSP Turbo II™ Vaporizers to provide a reliable, high-performance liquid vapor delivery solution for semiconductor thin film deposition processes (including CVD, PECVD...
AeroTrak Cleanroom Condensation Particle Counter 9001
水基 AeroTrak®9001型洁净室凝聚核粒子计数器 (CPC) 具有极低的误计率, 能够为客户提供可靠的环境监测和气体处理-保持您的产品安全免受纳米微粒污染。
VPG-A3 Inline Filter
High efficiency filtration down to 2nm and up to 100 SLPM.The VPG-A3 Vapor Process Gas filter is an ultra-low pressure drop, highly-efficient in-line filter designed for vapor and process gas filtration. This patent-protected 316L SS filter, is chemically and thermally...
Qual-Dep Qualification Wafer Contamination Standards
MSP's Qual-Dep™ Wafer Qualification Contamination Standards are designed to meet your precise tool qualification needs, offering reliable solutions for validating and aligning inspection systems for ensuring optimal performance and reducing risks in semiconductor manufacturing.
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