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The Condensation Particle Counter (CPC) 3750-10 is designed to ensure precise monitoring of ultrafine particles (UFPs) in the atmosphere, meeting the highest standards of accuracy and reliability.

The Super Capacity Pump SCP6 is engineered to deliver exceptionally high flow rates for the most demanding inhalation device testing applications.

The MSP Wafer Recertification Program provides a cost-effective and efficient solution for helping ensure the precision of your calibration standards, verifying your wafer inspection and metrology tools operate with the preferred degree of accuracy. By recertifying your...

Reticle/photomask contamination standards consist of particles deposited on 6 inch reticles with the industry's best particle size and count control. These certified standards for reticle inspection tools are totally customized for each customer.

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