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Le compteur de particules à base d'eau AeroTrak® 9001 Cleanroom Condensation Particle Counter (CPC) fournit des taux de faux comptage extrêmement bas pour surveiller en toute confiance les mini-environnements et les gaz de processus - protégeant vos produits de la...

*Merci de noter que cette page est disponible en anglais uniquement.*Filtration down to 1 nm and below

MSP, a Division of TSI, supplies wafer contamination standards and reticle contamination standards in the semiconductor industry for consistent and repeatable particle size and count control.

It is crucial in both automotive and industrial electronics to ensure optimal performance and longevity of sensitive components. Effective contamination control practices in the sectors like photonics and optics, data farms and automotive applications (e.g. MEMS, paint, EV...

MSP's Qual-Dep™ Wafer Qualification Contamination Standards are designed to meet your precise tool qualification needs, offering reliable solutions for validating and aligning inspection systems for ensuring optimal performance and reducing risks in semiconductor manufacturing.

MSP’s Turbo II™ Vaporizer helped a CVD OEM double output and cut defects - boosting yield, efficiency, and customer satisfaction in tight gas box spaces.