tsi logo

SEARCH

Particle Size Standards

Calibrate your surface scanning equipment

Particle Size Standards

*Merci de noter que cette page est disponible en anglais uniquement.*

 

Whether testing for particle size, count, or composition, it is imperative to use reliable particle suspensions to calibrate your surface scanning equipment or particle counters. A particle standard consists of a specific size range and number concentration of solid particles suspended in ultra-pure water (UPW). This suspension is dispersed into clean air or nitrogen and deposited onto wafers and reticles in specific patterns and sizes.

Particle Standards are used to produce high-quality calibration standards for calibrating, qualifying, and monitoring the performance of wafer and photomask inspection systems.

MSP particle suspensions are available in two categories:

NanoSilica Size Standards

MSP’s NanoSilica™ Size Standards are concentrated suspensions of amorphous SiO2 particles with highly uniform size distributions, suspended in ultra-pure water (UPW).

$1220,00 USD

Process Particles Suspensions

Process Particles™ Suspensions are used as particle material standards. They represent real-world contaminant particles encountered in semiconductor device fabrication processing.

$3015,00 USD