Semicon West 2026

TSI® and MSP, a division of TSI, are heading to SEMICON West 2026, where the industry comes together to solve semiconductor industry manufacturing challenges, accelerate innovation and build strategic partnerships. Stop by our exhibit space to see how our contamination control, particle monitoring, and process integrity solutions are helping semiconductor manufacturers protect yield across the fab.

What You'll Find at Our Booth

TSI Solutions:

• UPW Monitoring — Detect nanoparticles down to 10 nm with the TSI Nano LPM™ System.

• Cleanroom Monitoring — Track airborne particle contamination to support cleanroom audit readiness

• Parts Cleanliness Testing — Verify the surface cleanliness that electronics manufacturing depends on

• Particle Detection in High-Purity Gases — Catch contamination before it becomes a defect

MSP Solutions:

• Surface Defect Inspection — Identify and address killer defects earlier in the process

• Particle Removal Efficiency Testing — Validate cleaning performance with wafers uniformly coated to known particle-size standards

• Thin Film Deposition and Removal — Vapor delivery systems built for ALD and CVD

Nanoscale Expertise for Tomorrow's Fab

TSI and MSP, a division of TSI, bring decades of recognized innovation to semiconductor manufacturing. Our instruments help fabs and equipment makers lower defect rates, streamline operations, and push yield higher.

Come by our booth at SEMICON West 2026 to talk with our technical specialists, see live demonstrations, and learn how TSI and MSP are keeping pace with the industry's next set of challenges.

We'll see you in San Francisco — stop in and talk shop with the team.

Explore Our Portfolio of Semiconductor Solutions >