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TSI & MSP at SEMICON Korea 2026

Join us at Booth A868!

SEMICON Korea 2026

11.02.2026 - 13.02.2026 Booth#: A868 semiconkorea.org

TSI and MSP, a Division of TSI, are pleased to announce our participation in SEMICON Korea 2026, one of Asia’s leading events for semiconductor manufacturing and advanced electronics. Join us in Seoul from February 11-13 to explore how our solutions support contamination control, process stability, precision metrology, and yield protection across the semiconductor ecosystem.
 

Visit Us at Booth A868

At this year’s event, we will showcase our portfolio of TSI and MSP solutions designed for critical applications in semiconductor manufacturing. From ultrapure water monitoring to wafer inspection TSI Nano LPM™ System for true 10 nanometer (nm) nanoparticle detection in semiconductor ultrapure water (UPW)and thin film deposition/removal, our technologies help fabs and equipment manufacturers ensure reliability, improve efficiency, and protect yield at every stage of production.
 

Featured Solutions

Ultrapure Water Monitoring
TSI Nano LPM™ System:
  • Provides confident, real-time detection of both suspended nanoparticles and dissolved content down to 10 nm
  • Enables process engineers to make data-driven decisions that prevent excursions, optimize maintenance, and protect your yield
Particle Removal Efficiency (PRE) Testing
  • IParticle removal efficiency (PRE)ndustry-standard challenge wafers uniformly coated with particle size standards
  • Support for cleaning process optimization and defect reduction
Thin Film Deposition & Vapor Delivery
  • Advanced solutions for ALD, CVD, and other precision deposition processes
Surface Defect & Particle Characterization
  • Precision inspection solutions supporting mask, reticle, and wafer evaluation
Cleanroom & Facility Monitoring
  • Real-time airborne particle monitoring to help ensure ISO cleanroom compliance
  • Robust environmental monitoring solutions to pass audits and maintain control of manufacturing spaces
High-Purity Gas Particle Detection
  • Monitoring of critical gases to reduce particle-induced defects in sensitive processes
Parts Cleanliness Testing
  • Reliable cleanliness verification solutions for components used in semiconductor equipment and wafer handling systems
 

Partnering with You for Tomorrow’s Manufacturing Challenges

As a trusted partner to the global semiconductor industry, TSI and MSP provide innovative, high-accuracy, and highly repeatable measurement technologies that help fabs reduce defects, optimize processes, and improve yield. Our team will be available onsite to discuss your applications, challenges, and technology needs.
 

Meet Us in Seoul

Whether you’re focused on contamination control, metrology, process development, or vapor delivery, we invite you to stop by Booth A868 to see what’s new and discover how TSI and MSP can support your manufacturing goals.

We look forward to meeting you at SEMICON Korea 2026!

More About Our Solutions for the Semiconductor Industry