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Discover how a leading Japanese semiconductor supplier achieved unprecedented cleanliness in their manufacturing processes with TSI's revolutionary Water-based Condensation Particle Counter 3789 (WCPC).

Poor testing can lead to low product quality and revenue loss. Using TSI particle counters enables real-time contamination detection, supporting process optimization and higher manufacturing efficiency.

MSP’s PRE testing solutions bring academic-level precision to fab-floor challenges, enabling engineers to validate cleaning performance with confidence.

Durchflussrate 1 CFM (28,3 L/min) / Partikelgrößen 0,3 bis 25 μm / Integrierte Pumpe

Durchflussrate 28,3 L/min (1 CFM) / Partikelgrößen 0,5 bis 25 μm / Integrierte Pumpe

Wasserbasierte Partikelzähler (Water-Based Condensation Particle Counters, kurz WCPCs) liefern präzise gemessene Konzentrationen gasgetragener Partikel unter Verwendung von umweltfreundlichem, sicherem und überall verfügbarem destilliertem Wasser. In Verbindung mit einem...

Compliance with ISO 14644 standards is essential to control airborne particulate contamination levels.

Glass wafers are increasingly used in semiconductor manufacturing. Learn more about the benefits and how MSP can help enhancing inspection systems with precise calibration and contamination standards.

As semiconductor processes become more sensitive, emerging UPW monitoring solutions are closing critical detection gaps by enabling real-time, nanoscale particle measurement that traditional methods miss.