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Durchflussrate 28,3 L/min (1 CFM) / Partikelgrößen 0,5 bis 25 μm / Integrierte Pumpe

Wasserbasierte Partikelzähler (Water-Based Condensation Particle Counters, kurz WCPCs) liefern präzise gemessene Konzentrationen gasgetragener Partikel unter Verwendung von umweltfreundlichem, sicherem und überall verfügbarem destilliertem Wasser. In Verbindung mit einem...

Glass wafers are increasingly used in semiconductor manufacturing. Learn more about the benefits and how MSP can help enhancing inspection systems with precise calibration and contamination standards.

As semiconductor processes become more sensitive, emerging UPW monitoring solutions are closing critical detection gaps by enabling real-time, nanoscale particle measurement that traditional methods miss.

Durchfluss 2,83 LPM (0,1 CFM) / Kanalgrößenoptionen 0,2 bis 25 μm / Integrierte Pumpe

Compliance with ISO 14644 standards is essential to control airborne particulate contamination levels.

We offer cutting-edge solutions tailored to the unique (nanoscale) challenges of the semiconductor manufacturing market. With our advanced instrumentation and expertise, we provide critical tools for process control, quality assurance, and cleanroom monitoring. Stay ahead of...

Discover how MSP's Particle Deposition System enables precise calibration of defect inspection systems crucial for maintaining high yields and quality in sub-10nm semiconductor devices.