Cal-Dep Calibration Contamination Standards

Precision in Defect Inspection

In the competitive landscape of electronics manufacturing, the accuracy of your defect inspection equipment directly impacts your bottom line. Cal-Dep™ Calibration Contamination Standards are engineered to support the rigorous demands of modern semiconductor fabrication. By providing a reliable baseline for particle size measurement, these standards help facilities managers and process engineers maintain the health of their inspection systems over the tool's entire lifespan. Consistent calibration helps reduce the risk of measurement drift, allowing for more reliable yield management and helping to avoid costly excursions in the manufacturing process.

Supporting Statistical Process Control (SPC)

Statistical Process Control is the backbone of high-yield manufacturing. Cal-Dep™ standards serve as a critical component in your SPC strategy by offering a consistent reference point for all your inspection tools. MSP’s advanced deposition technology enables the creation of standards with uniform particle distributions, which allows you to benchmark tools against one another effectively. This capability is essential for "tool matching"—the process of verifying that different tools in the same fab, or across multiple global fabs, produce comparable results.

Global Alignment and Efficiency

For organizations operating multiple fabrication facilities, achieving global alignment in process control can be challenging. Cal-Dep™ Calibration Contamination Standards facilitate this alignment by providing a universal standard for tool calibration. When all sites utilize the same high-precision standards, it becomes easier to standardize recipes and protocols, helping to streamline operations and improve overall efficiency. Whether you are calibrating a single tool or harmonizing a fleet of systems worldwide, Cal-Dep™ standards assist in delivering the consistent data required to make informed process decisions.