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*Merci de noter que cette page est disponible en anglais uniquement.*This fully automated particle deposition system deposits PSL and SiO2 spheres as small as 10 nm. Calibrate and qualify your defect inspection tools with ease, confidence, and efficiency by producing high...

*Merci de noter que cette page est disponible en anglais uniquement.*This fully automated particle deposition system deposits PSL and SiO2 spheres as small as 20 nm. Calibrate and qualify your defect inspection tools with ease, confidence, and efficiency by producing high...

MSP's Turbo II™ Vaporizer 2855NP is designed for applications that require mid to high vapor flow rates. Based off of the field proven, highly reliable, and low-maintenance MSP Turbo™ Vaporizers, the new 2855NP delivers twice the vapor output in a footprint that is half the...

*Merci de noter que cette page est disponible en anglais uniquement.*This manually-loaded particle deposition system deposits PSL and SiO2 spheres as small as 30 nm. Calibrate and qualify your defect inspection tools with ease, confidence, and efficiency by producing high...

Built upon field proven technology, the MSP Turbo™ Liquid Flow Controllers 2950 were engineered to pair with MSP Turbo II™ Vaporizers to provide a reliable, high-performance liquid vapor delivery solution for semiconductor thin film deposition processes (including CVD, PECVD...

Le compteur de particules à base d'eau AeroTrak® 9001 Cleanroom Condensation Particle Counter (CPC) fournit des taux de faux comptage extrêmement bas pour surveiller en toute confiance les mini-environnements et les gaz de processus - protégeant vos produits de la...

*Merci de noter que cette page est disponible en anglais uniquement.*Filtration down to 1 nm and below

MSP's Qual-Dep™ Wafer Qualification Contamination Standards are designed to meet your precise tool qualification needs, offering reliable solutions for validating and aligning inspection systems for ensuring optimal performance and reducing risks in semiconductor manufacturing.