MSP Wafer Recertification Program

Produktdetails

Our comprehensive recertification process certifies the current particle size and count, providing reliable performance for critical process control. Each recertification includes a certificate detailing the count and size condition of the particles on the wafer, helping ensure complete transparency and quality assurance. Specifications include:

• Traceability: All recertifications are measured using NIST traceable equipment and processes, providing documented accuracy.
• Supported Wafer Sizes: 200mm and 300mm.
• Material Types: Silicon Dioxide (SiO2) and Polystyrene Latex (PSL) spheres.
• Turnaround Time: Standard 4-week turnaround to minimize downtime.

Applications

The MSP Wafer Recertification Program supports a wide range of critical applications in the semiconductor industry, enabling precise measurement and process optimization.

• Device manufacturing process control
• Defect inspection tool development and qualification
• Validation of cleaning efficiency
• Metrology tool calibration and monitoring
• Baseline monitoring for process tool contamination

Features and Benefits

• Preserve Asset Life: Maximizes existing wafer value and reduces waste.
• NIST Traceability: Every recertified wafer is backed by certified accuracy.
• KLA Surfscan Inspection: Advanced inspection helps ensure optimal wafer quality.
• Custom Recipe Development: Supports a range of calibration and process needs.
• OEM Compliance: Integrates easily with existing systems.
• Certificate of Conformance: Provides detailed documentation and wafer map.
• Cost Savings: Minimizing the risks of using wafers with unknown performance.
• Improved Tool Accuracy: Maintains and enhances performance and yield