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Maintaining high purity gases is vital to avoid defects and ensure semiconductor quality. Best practices include real-time monitoring of particles as small as 2 nm and strict regulatory compliance.

Discover how a leading Japanese semiconductor supplier achieved unprecedented cleanliness in their manufacturing processes with TSI's revolutionary Water-based Condensation Particle Counter 3789 (WCPC).

Explores how Direct Liquid Injection (DLI) systems and Fourier Transform Infrared (FTIR) spectroscopy are used to optimize the delivery of high-k dielectric precursors.

Débit d´écoulement 1 CFM (28,3 L/min) / Plage de mesures 0,3 à 25 μm / Pompe Intégrée

Débit d´écoulement 28,3 L/min (1 CFM) / Plage de mesures 0,5 to 25 μm / Pompe Intégrée

Les compteur de noyeaux de condensation (CNC) à eau assurent des concentrations précises des particules dans les gaz tout en utilisant de l'eau distillée à la fois écologique, sure et aisément disponible. En le combinant avec un appareil de mesure de taille de particules, il...

MSP’s PRE testing solutions bring academic-level precision to fab-floor challenges, enabling engineers to validate cleaning performance with confidence.

Poor testing can lead to low product quality and revenue loss. Using TSI particle counters enables real-time contamination detection, supporting process optimization and higher manufacturing efficiency.

Débit 0.1 CFM (2.83 LPM) / Options de taille de canal 0.2 à 25 μm / Pompe intégrée