FILTECH 2026 - The Filtration Event
TSI is pleased to exhibit at FILTECH 2026, the leading international event for filtration and separation technology. Visit us in Hall 8, Booth E37 to discover comprehensive testing solutions for every stage — from R&D and quality control to full-scale production.
Free Exhibition Passes - Click Here
Testing Solutions for Every Stage – R&D, Quality Control, and Production
- Respirator, cabin air & ventilation filters
- HEPA/ULPA filters & filter media
- Nanoparticle penetration & coated materials
- Microplastics, brake wear & indoor air quality (IAQ)
Featured Solution: TSI® 3340A Laser Aerosol Spectrometer (LAS)
Ultra-high sensitivity. Superior resolution.
Stop by our booth to explore the TSI 3340A Laser Aerosol Spectrometer, a trusted solution for precise, high-resolution particle size and concentration measurements in filter testing applications. The 3340A LAS delivers:
- Detection of particles below 0.1 μm
- High counting efficiency compared to conventional optical solutions
- Simple, user-friendly operation
- NIST-traceable calibration and compliance with ISO 21501-1
Why Visit TSI at FILTECH?
Innovative Filter Testing Solutions: Learn about our state-of-the-art automated filter testers tailored for filter efficiency and performance testing.
Expertise You Can Trust: Our equipment is supported by decades of industry-leading expertise in the filtration sector, ensuring you receive the most accurate and reliable results.
Explore HEPA/ULPA and Fractional Efficiency Testing: Discover how our solutions can enhance your filter quality and development processes. It is ideal for applications including CADR testing, HEPA/ULPA filter evaluation, and advanced filtration performance analysis.
We look forward to meeting you at FILTECH 2026 and discussing how our filter testing solutions can support your projects!
Free Exhibition Passes
Interested in attending? We’re offering free passes to FILTECH 2026! Simply fill out the form below to secure your complimentary entry and join us at this exciting event.