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MSP, a Division of TSI, supplies wafer contamination standards and reticle contamination standards in the semiconductor industry for consistent and repeatable particle size and count control.

The Apex2 Pro version offers the highest level of monitoring with flows to 5L/min. Featuring all the capabilities of the Standard and Plus models, the Apex2 Pro adds datalogging of flow, pressure and motion, aswell as programmable on and off timers. Remotely monitor and...

The VAPex air sampling pump has been designed particularly for low flow personal sampling of vapours and gases in working environments. Its Intrinsically Safe design and remote operation via the Airwave App makes it ideal for modern day sampling requirements.

QCM MOUDI™撞击式采样器是一款基于QCM（石英晶体微量天平）传感器可实时检测质量的精密科研级撞击式分级采样器。撞击式分级采样器有一个2.5 -µm入口和六个具有清晰采集效率曲线的QCM等级，当进口流量为10-L/min时，校准切割点为960，510，305，156，74 和45 nm。

AirAssure™ IAQ Monitor in combination with TSI Link Solutions™ software are essential to creating, managing, and deploying your IAQ program. The 2-gas AirAssure™ IAQ Monitor measures carbon dioxide (CO2), total volatile organic compounds (tVOC), particulate matter (PM...

AirAssure™ IAQ Monitor in combination with TSI Link Solutions™ software are essential to creating, managing, and deploying your IAQ program. The 4-gas AirAssure™ IAQ Monitor measures formaldehyde, CO, tVOCs, CO2, particulate matter, barometric pressure, temperature and...

The Q-Trak™ XP Indoor Air Quality Monitor Model 7585 unites gas and particle measurements with traditional IAQ parameters -- in one lightweight, handheld instrument that is easy to use, configure and calibrate in the field. Designed for IAQ and industrial hygiene professionals...

范围：0至±300标准升/分钟 准确度：读数的2% 校准：空气、氧气、氮气 包括标准配件套件

Formaldehyde (HCHO) Module for TSI OmniTrak™ Solution.This product is only available in the US, Canada, United Kingdom, European Union, Switzerland, Norway and Australia. 

选择您气溶胶测量对的全球标准配置。  TSI扫描电迁移率粒径谱仪(SMPS™)扫描电迁移率粒径谱仪帮助研究者取得了气溶胶研究的新突破，并协助校准参考材料和其它气溶胶仪器。美国国家标准技术研究所（NIST）和世界各地的许多其它参考实验室使用TSI SMPS™进行亚微米粒径分布测量。TSI SMPS™扫描电迁移率粒径谱仪是研究人员用于纳米粒子粒径分布测量的最佳选择。通用版第三代3938型扫描电迁移率粒径谱仪SMPS采用模块化、基于组件的设计，不但具有非常高的粒径分辨率，还具有快速扫描（每次扫描小于15秒）和自动组件识别功能。TSI SMPS易于使用...