Qual-Dep™ Qualification Wafer and Reticle Contamination Standards from MSP, a Division of TSI, ensure tool-specific validation, reducing acceptance risks and aligning inspection systems.
Certify inspection tool performance in semiconductor fabs with Qual-Dep™ Qualification Contamination Standards to ensure adherence to specifications and accelerate customer acceptance. These customized standards streamline procurement and offer volume pricing benefits.
Regularly assess inspection tool performance using Qual-Dep™ Qualification Standards to support statistical process control (SPC) in manufacturing. MSP's consistent particle deposition enables reliable matching of tool performance within and across fabs, ensuring operational integrity globally.
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Bringing new inspection equipment online is a critical phase in fab expansion and technology upgrades. Qual-Dep™ Qualification Contamination Standards are specifically tailored to assist in this process. By providing a verified standard that aligns with original equipment manufacturer (OEM) specifications, these wafers and reticles help streamline the site acceptance testing (SAT) process. Facilities managers can use these standards to confirm that incoming tools perform as promised, helping to avoid disputes and delays during installation. This clear validation path supports faster time-to-production for capital investments.
The procurement of advanced metrology and inspection tools involves significant capital expenditure. Qual-Dep™ standards help mitigate the financial and operational risks associated with these purchases by providing an objective metric for performance verification. When both the equipment supplier and the fab utilize the same high-quality qualification standards, it creates a transparent framework for tool sign-off. This alignment helps ensure that all parties have confidence in the tool’s capability to detect defects at the required sensitivity levels, reducing the likelihood of unexpected performance issues post-installation.
Beyond initial qualification, Qual-Dep™ standards play a vital role in ongoing manufacturing health. Regular assessment using these standards supports robust Statistical Process Control (SPC) methodologies. By maintaining a consistent check on tool performance, engineers can detect drift and variability early. Furthermore, MSP’s precise particle deposition technology allows for reliable matching of tool performance across different modules and facility locations. This consistency is key to maintaining global operational integrity, enabling seamless production transfer and capacity management across a worldwide manufacturing network.