TSI Events

ETH Nanoparticles Conference 2025

2025/6/16 - 2025/6/19 Swiss Federal Institute of Technology Zurich (ETHZ) - Main Building, Rämistrasse 101, 8092 Zurich, Switzerland

Join TSI at the 28th ETH Nanoparticles Conference in Zurich, June 16-19, 2025, to explore the latest in nanoparticle research and technologies.

Tradeshow

AAMI

2025/6/20 - 2025/6/23 New Orleans

Join us June 20-23 for AAMI, bringing the elite medtech companies in New Orleans and beyond to see the latest solutions in healthcare technology management.

Conference

AVS 25th International Conference on Atomic Layer Deposition (ALD 2025)

2025/6/22 - 2025/6/25 International Convention Center Jeju (ICC Jeju), Jeju Island, South Korea

Join us at the prestigious ALD/ALE 2025 conference in South Korea, where you can meet our expert Andrea Geer.

Tradeshow

EBME Expo 2025

2025/6/25 - 2025/6/26 Coventry, England, UK

Conference

Filter materials that can be tested by TSI instrumentation

World Filtration Congress 2025

2025/6/30 - 2025/7/4 Booth #80 Palais des Congrès, Avenue Jean-Gabriel Domergue, 33 300 Bordeaux, France

At the World Filtration Congress 2025, TSI invites you to discover our latest innovations in filter testing at booth #80.

Seminar

48th Edition of Aerosol and Particle Measurement Short Course 2025

2025/8/18 - 2025/8/20 University of Minnesota, with Hands-on at TSI Incorporated

Join us for this internationally recognized Short Course on Aerosol and Particle Measurement, presented in cooperation with the U of Minnesota.

Conference

European Aerosol Conference EAC 2025

2025/8/31 - 2025/9/5 Grand Hotel Tiziano e dei Congressi, Via Porta d'Europa, 73100 Lecce LE, Italien

Join TSI at EAC 2025 in Lecce! Explore cutting-edge air quality monitoring tech & our new TSI OmniCount™ PWCPC. Don't miss it!

Conference

SPIE Photomask Technology + Extreme Ultraviolet Lithography

2025/9/21 - 2025/9/25 Monterey Conference Center, 1 Portola Plaza Monterey, CA 93940

Visit MSP, a Division of TSI®, at SPIE Photomask 2025! Discover advanced surface defect inspection solutions, including PRE Challenge Photomasks for particle removal efficiency testing.

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