Air / Oxygen Gas Mass Flow Meter (plus Kit) 5300-2
Range: 0 to ± 300 Std L/min
Accuracy: 2% of reading
Calibration: Air, O2, N2*
Includes Standard Accessory Kit*Nitrogen gas is a correction from the air calibrationISO 17025 Accredited Version
Online Service Request for Repair/Calibration
Request calibration or service for your TSI instrument.
Oxygen Gas Mass Flow Meter (plus Kit) 5310-4-AC
Flowmeter +DP, 300 lpm, O2, 22mm, 1/2 inchISO 17025 CertifiedRange: 0 to ± 300 Std L/min
Accuracy: 2% of reading
Calibration: O2
Includes Standard Accessory Kit
Growing Cities to Monitor Air Quality for Urban Planning
Air quality measured at the hyperlocal level in real time provides communities with critical data about exposure to pollutants.
SEMICON Europa 2025
Sampling System for Atmospheric Particles 3750200
Representative sampling of ultrafine particles requires appropriate conditioning and transport of the aerosol sample. The model 3750200 is designed to deliver a representative sample of ambient air to particle measurement instruments.
How do manufacturers manage product risk using cleanroom monitoring data?
Real-time monitoring ensures compliance, aids in root cause analysis, and supports continuous improvement, enhancing overall operational efficiency and regulatory adherence.
Particle Generator 8026
The Particle Generator Model 8026 is a unique instrument that supplements the ambient particle count, allowing the PortaCount Pro+ Respirator Fit Tester to be operated in areas where the normal particle count is not sufficient.
Aerosol Diluter 3333-10
Monitoring ambient particle concentrations at pollution hot spots such as major traffic junctions, motorways, airports, or seaports can be challenging for Condensation Particle Counters (CPCs). The high concentrations of ultrafine particles can frequently exceed the maximum...
Extend Your Calibration Wafer Lifecycle with NIST-Traceable Recertification
Continuing to use wafers with unknown performance introduces risk. Our recertification service provides NIST-traceable verification of your contamination wafers.
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