The AeroTrak™ 9001 Cleanroom CPC is specifically designed for ultra-clean semiconductor manufacturing providing incredibly low false-counts and real-time 10 nm sensitivity nanoparticle detection at a 0.1 cfm flow rate for detecting particles in the air or inert pressurized gases—something 0.1 µm particle counting instruments cannot.
Product Web Page > View
Application Note — Comparison of Cleanroom CPC Working Fluids > View US | View A4
Video — Instrument Introduction > View
Video Demo — Nanoparticle Detection for Semiconductor Fabrication Using TSI AeroTrak 9001 Cleanroom CPC > View
Instrument Manual > View
Quick Start Guide > View
Pump Priming Tool Instructions (Automated and Manual Pump Priming Procedure) > View
Firmware v5.2 Release > View signed release note | Download exe files
Webinar Recording — Troubleshooting the AeroTrak 9001 Cleanroom CPC > View
View complete TSI solution for Contamination Control for Monitoring Ultra-Clean Semiconductor Environments.