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AeroTrak™ 9001 Cleanroom Condensation Particle Counter (CPC)

10 nm Measurement Like No Other. 


The AeroTrak™ 9001 Cleanroom CPC is specifically designed for ultra-clean semiconductor manufacturing providing incredibly low false-counts and real-time 10 nm sensitivity nanoparticle detection at a 0.1 cfm flow rate for detecting particles in the air or inert pressurized gases—something 0.1 µm particle counting instruments cannot.

Public Resources

  • Product Web Page > View

  • Product Specification Sheet >  View US   | View A4

  • Application Note — Comparison of Cleanroom CPC Working Fluids > View US  | View A4

  • Video — Instrument Introduction > View

  • Video Demo — Nanoparticle Detection for Semiconductor Fabrication Using TSI AeroTrak 9001 Cleanroom CPC > View

Confidential Resources

View complete TSI solution for Contamination Control for Monitoring Ultra-Clean Semiconductor Environments.