CONTAMINATION CONTROL

If you are managing a cleanroom or sterile products manufacturing operation, or if you are tasked with managing biocontamination and infection control, it is critical to develop and implement an effective contamination control program. As science progresses, the need for cleanrooms in bio-tech, pharmaceutical, medical device, semiconductor, and nanotechnology will continue to grow.

 

TSI offers a full line of instruments for airflow, air velocity, HEPA filter leak tests, particle counters and sizers, ultrafine particle counters, differential pressure, temperature and humidity. Our expertise in investigating, identifying and solving measurement problems offers you the contamination control you need to minimize your facility’s risk.

 

RELATED NEWS

TSI ACQUIRES ADAMS INSTRUMENTS AND FACILITY MONITORING SYSTEMS LTD — October 1, 2008 - TSI Incorporated, a worldwide leader in measurement technology, announces the acquisition of Adams Instruments and Facility Monitoring Systems Ltd. (FMS). TSI INCORPORATED AWARDED GSA CONTRACT WITH THE US FEDERAL GOVERNMENT — January 1, 2009 -- TSI Inc. has been awarded a GSA (General Services Administration) Multiple Award Schedule contract, GS-07F-0428U, with the US Federal Government. This schedule 66 contract allows TSI’s government customers to streamline their purchasing of TSI instruments and services. Some of the TSI products available through the GSA contract include the ACCUBALANCE® Air Capture Hoods, AEROTRAK™ Handheld Particle Counters, Certifier FA ventilator tester, IAQ-CALC™ Meter, PORTACOUNT® Respirator Fit Tester, P-TRAK® Ultrafine Particle Counter, and the VelociCalc Series Multi-Function Ventilation Test Instrument.TSI ACQUIRES SYSTEMPLUS TECHNOLOGY PTE LTD — January 21, 2009 ---- TSI Incorporated, a worldwide leader in aerosol measurement technology, announces the acquisition of SystemPlus Technology Pte Ltd., a service center known for high quality service and calibration.TSI ACQUIRES CERTAIN ASSETS OF PARTICLE METRICS INCORPORATED — April 7, 2009 -- TSI Incorporated, a worldwide leader in aerosol measurement technology and Research Electro-Optics, Inc. of Boulder, Colorado an industry leading manufacturer of precision optics are jointly announcing that TSI is acquiring certain assets related to the Helium Neon technology of Particle Metrics Incorporated (PMI), an OEM of patented contamination control technology and a wholly owned subsidiary of REO. TSI DELIVERS IN TIME OF NEED — June 11, 2009 -  the World Health Organization, (WHO), announced that the world is now at the start of the 2009 influenza pandemic. The Influenza virus A(H1N1) is contagious, spreading easily from one person to another, and from one country to another. As of today, nearly 30,000 confirmed cases have been reported in 74 countries.UNIVERSITY OF MINNESOTA AND TSI OFFER 35TH ANNUAL AEROSOL AND PARTICLE MEASUREMENT SHORTCOURSE —  

RELATED EVENTS

September 09, 2010 –
September 10, 2010
DISKCON USA
Santa Clara, CA
Visit TSI at the Show Booth #123
October 06, 2010 –
October 06, 2010
ISPE Boston
Boston, MA
Visit TSI at the Show
November 23, 2010 –
November 26, 2010
PHARMTECH 2010
VVC, pavilion 75, Moscow, Russia
Visit TSI at the Show
March 29, 2011 –
March 31, 2011
Interphex NY
New York, New York
Visit TSI at the Show

RELATED PROMOTIONS

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APPLICATION NOTES

 Airborne Challenges (ITI-096)
 Airborne Challenges (ITI-096-A4)
 CDC Update on Tuberculosis Progress Made--Continued Efforts Needed Managing the Risk (LC-121)
 Choosing an Optical Particle Counter (ITI-095)
 Choosing an Optical Particle Counter (ITI-095-A4)
 Mechanisms of Filtration for High Efficiency Fibrous Filters (ITI-041)
 Mechanisms of Filtration for High Efficiency Fibrous Filters (ITI-041-A4)
 Using Particle Counters for Testing HEPA Filters (ITI-097)
 Using Particle Counters for Testing HEPA Filters (ITI-097-A4)

BROCHURES

 Contamination Control for Electronic and Semiconductor Applications
 Contamination Control for Electronic and Semiconductor Applications (A4)
 Contamination Control for Life Science Applications
 Contamination Control for Life Science Applications (A4)
 FMS 5.0 Facility Monitoring Software for Electronic and Semiconductor Applications
 FMS 5.0 Facility Monitoring Software for Electronic and Semiconductor Applications (A4)
 FMS 5.0 Facility Monitoring Software for Life Science Applications
 FMS 5.0 Facility Monitoring Software for Life Science Applications (A4)

SPEC SHEETS

 Aerosol Sampling Manifold M32-01
 Aerosol Sampling Manifold M32-01 (A4)
 Model 7110
 Model 7110 (A4)
 Model 7110 Accessories Sheet
 Model 7110 Accessories Sheet (A4)
 Model 7301P
 Model 7301P (A4)
 Model 8220
 Model 9110
 Model 9110 (A4)
 Model 9110 Accessories Sheet
 Model 9110 Accessories Sheet (A4)
 Model 9303
 Model 9303 (A4)
 Model 9303 Accessories Sheet
 Model 9303 Accessories Sheet (A4)
 Model 9306
 Model 9306 (A4)
 Model 9306 Accessories Sheet
 Model 9306 Accessories Sheet (A4)
 Model 9500
 Model 9500 (A4)
 Models 7201, 7301, 7501
 Models 7201, 7301, 7501 (A4)
 Models 7201, 7301, 7501 Accessories Sheet
 Models 7201, 7301, 7501 Accessories Sheet (A4)
 Models 7310, 7510
 Models 7310, 7510 (A4)
 Models 7310/7510 Accessories Sheet
 Models 7310/7510 Accessories Sheet (A4)
 Models 9310, 9510
 Models 9310, 9510 (A4)
 Models 9310, 9510, 9350, 9550, 9500 Accessories Sheet
 Models 9310, 9510, 9350, 9550, 9500 Accessories Sheet (A4)
 Models 9350, 9550
 Models 9350, 9550 (A4)

TECHNICAL NOTES

 Particle Size
 Particle Size Range for TSI Exposure Monitoring Instruments